Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs: Fid-Bau Portal

Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs

Salviati, G. / Armani, N. / Cova, P. / Meneghesso, G. / Zanoni, E.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs

Salviati, G. / Armani, N. / Cova, P. / Meneghesso, G. / Zanoni, E.

Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs

Salviati, G. / Armani, N. / Cova, P. / Meneghesso, G. / Zanoni, E.

Zugriff

Zugriff über TIB

Verfügbarkeit in meiner Bibliothek prüfen

Bestellung bei Subito €

Seitennavigation

Dokumentinformationen

Ähnliche Titel

Exportieren, teilen und zitieren

Dokumentinformationen

Titel:

Correlation between hot-electron-stress-induced degradation and cathodoluminescence in InP-based HEMTs

Beteiligte:

Salviati, G. (Autor:in) / Armani, N. (Autor:in) / Cova, P. (Autor:in) / Meneghesso, G. (Autor:in) / Zanoni, E. (Autor:in)

Erschienen in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 80 ; 289 - 293

Erscheinungsdatum:

01.01.2001

Format / Umfang:

5 pages

ISSN:

0921-5107

Medientyp:

Aufsatz (Zeitschrift)

Format:

Sprache:

Englisch

Klassifikation:

DDC: 620.11

Nagpure, I. M. / Pitale, S. S. / Coetsee, E. et al. | British Library Online Contents | 2011

Hot Electron Induced Current Collapse in AlGaN/GaN HEMTs

Nakajima, A. / Yagi, S. / Shimizu, M. et al. | British Library Online Contents | 2007

Correlation between static characteristics and deep levels in InAlAs/InGaAs/InP HEMTS

Ben Salem, M. M. / Bouzgarrou, S. / Sghaier, N. et al. | British Library Online Contents | 2006

Correlation between cathodoluminescence and structural defects in ZnS/GaAs(100) and ZnSe/GaAs(100) studied by transmission electron microscopy

Mitsui, T. / Yamamoto, N. / Yoshino, J. et al. | British Library Online Contents | 1996

Correlation between cathodoluminescence and structural defects in ZnS/GaAs(100) and ZnSe/GaAs(100) studied by transmission electron microscopy

Mitsui, T. / Yamamoto, N. / Yoshino, J. et al. | British Library Online Contents | 1996

Nach oben