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Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III-V semiconductor device structures
Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III-V semiconductor device structures
Contactless electromodulation and surface photovoltage spectroscopy for the nondestructive, room temperature characterization of wafer-scale III-V semiconductor device structures
Pollak, F. H. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 80 ; 178 - 183
2001-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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