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    A TEM and SEM-cathodoluminescence study of oval defects in graded InGaAs/GaAs buffer layers

    New search for: Lazzarini, L.
    New search for: Salviati, G.
    New search for: Franchi, S.
    New search for: Napolitani, E.

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    A TEM and SEM-cathodoluminescence study of oval defects in graded InGaAs/GaAs buffer layers

    New search for: Lazzarini, L.
    New search for: Salviati, G.
    New search for: Franchi, S.
    New search for: Napolitani, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    A TEM and SEM-cathodoluminescence study of oval defects in graded InGaAs/GaAs buffer layers

    New search for: Lazzarini, L.
    New search for: Salviati, G.
    New search for: Franchi, S.
    New search for: Napolitani, E.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Document information
    Title:

    A TEM and SEM-cathodoluminescence study of oval defects in graded InGaAs/GaAs buffer layers

    Contributors:

    Lazzarini, L. (author) / Salviati, G. (author) / Franchi, S. (author) / Napolitani, E. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 80 ; 120 - 124

    Publication date:

    2001-01-01

    Size:

    5 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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