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Characterisation of nitride thin films by electron backscattered diffraction

Trager-Cowan, C. / Manson-Smith, S. K. / Cowan, D. A. / Sweeney, F. / McColl, D. / Mohammed, A. / Timm, R. / Middleton, P. G. / O'Donnell, K. P. / Zubia, D.

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Characterisation of nitride thin films by electron backscattered diffraction

Trager-Cowan, C. / Manson-Smith, S. K. / Cowan, D. A. / Sweeney, F. / McColl, D. / Mohammed, A. / Timm, R. / Middleton, P. G. / O'Donnell, K. P. / Zubia, D.

Characterisation of nitride thin films by electron backscattered diffraction

Trager-Cowan, C. / Manson-Smith, S. K. / Cowan, D. A. / Sweeney, F. / McColl, D. / Mohammed, A. / Timm, R. / Middleton, P. G. / O'Donnell, K. P. / Zubia, D.

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Title:

Characterisation of nitride thin films by electron backscattered diffraction

Contributors:

Trager-Cowan, C. (author) / Manson-Smith, S. K. (author) / Cowan, D. A. (author) / Sweeney, F. (author) / McColl, D. (author) / Mohammed, A. (author) / Timm, R. (author) / Middleton, P. G. (author) / O'Donnell, K. P. (author) / Zubia, D. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 82 ; 19 - 21

Publication date:

2001-01-01

Size:

3 pages

ISSN:

Type of media:

Article (Journal)

Type of material:

Print

Language:

English

Classification:

© Metadata Copyright the British Library Board and other contributors. All rights reserved.

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