Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging: Fid-Bau Portal

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

Trager-Cowan, C. / Sweeney, F. / Winkelmann, A. / Wilkinson, A. J. / Trimby, P. W. / Day, A. P. / Gholina, A. / Schmidt, N. H. / Parbrook, P. J. / Watson, I. M.

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Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

Trager-Cowan, C. / Sweeney, F. / Winkelmann, A. / Wilkinson, A. J. / Trimby, P. W. / Day, A. P. / Gholina, A. / Schmidt, N. H. / Parbrook, P. J. / Watson, I. M.

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

Trager-Cowan, C. / Sweeney, F. / Winkelmann, A. / Wilkinson, A. J. / Trimby, P. W. / Day, A. P. / Gholina, A. / Schmidt, N. H. / Parbrook, P. J. / Watson, I. M.

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Document information

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Document information

Title:

Characterisation of nitride thin films by electron backscatter diffraction and electron channelling contrast imaging

Contributors:

Trager-Cowan, C. (author) / Sweeney, F. (author) / Winkelmann, A. (author) / Wilkinson, A. J. (author) / Trimby, P. W. (author) / Day, A. P. (author) / Gholina, A. (author) / Schmidt, N. H. (author) / Parbrook, P. J. (author) / Watson, I. M. (author)

Published in:

MATERIALS SCIENCE AND TECHNOLOGY -LONDON- ; 22 ; 1352-1358

Publication date:

2006-01-01

Size:

7 pages

ISSN:

0267-0836

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Naresh-Kumar, G. / Thomson, D. / Nouf-Allehiani, M. et al. | British Library Online Contents | 2016

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Naresh-Kumar, G. / Thomson, D. / Nouf-Allehiani, M. et al. | British Library Online Contents | 2016

Reprint of: Electron channelling contrast imaging for III-nitride thin film structures

Naresh-Kumar, G. / Thomson, D. / Nouf-Allehiani, M. et al. | British Library Online Contents | 2016

Methods for determining elastic strains from electron backscatter diffraction and electron channelling patterns

Wilkinson, A. J. | British Library Online Contents | 1997

Characterisation of nitride thin films by electron backscattered diffraction

Trager-Cowan, C. / Manson-Smith, S. K. / Cowan, D. A. et al. | British Library Online Contents | 2001