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    Grazing incidence structural characterization of InAs quantum dots on GaAs(0 0 1)

    New search for: Zhang, K.
    New search for: Heyn, C.
    New search for: Hansen, W.
    New search for: Schmidt, T.
    New search for: Falta, J.

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    Grazing incidence structural characterization of InAs quantum dots on GaAs(0 0 1)

    New search for: Zhang, K.
    New search for: Heyn, C.
    New search for: Hansen, W.
    New search for: Schmidt, T.
    New search for: Falta, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Grazing incidence structural characterization of InAs quantum dots on GaAs(0 0 1)

    New search for: Zhang, K.
    New search for: Heyn, C.
    New search for: Hansen, W.
    New search for: Schmidt, T.
    New search for: Falta, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Grazing incidence structural characterization of InAs quantum dots on GaAs(0 0 1)

    Contributors:

    Zhang, K. (author) / Heyn, C. (author) / Hansen, W. (author) / Schmidt, T. (author) / Falta, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 175-176 ; 606-612

    Publication date:

    2001-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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