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The electrical properties of MIS capacitors with ALN gate dielectrics
The electrical properties of MIS capacitors with ALN gate dielectrics
The electrical properties of MIS capacitors with ALN gate dielectrics
Adam, T. (author) / Kolodzey, J. (author) / Swann, C. P. (author) / Tsao, M. W. (author) / Rabolt, J. F. (author)
APPLIED SURFACE SCIENCE ; 175-176 ; 428-435
2001-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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