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Determining Young's modulus of conductive thin films by a thermal bend beam test

Shen, W. / Tang, C. Y. / Li, W. / Peng, L. H.

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Determining Young's modulus of conductive thin films by a thermal bend beam test

Shen, W. / Tang, C. Y. / Li, W. / Peng, L. H.

Determining Young's modulus of conductive thin films by a thermal bend beam test

Shen, W. / Tang, C. Y. / Li, W. / Peng, L. H.

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Access via TIB

Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Determining Young's modulus of conductive thin films by a thermal bend beam test

Contributors:

Shen, W. (author) / Tang, C. Y. (author) / Li, W. (author) / Peng, L. H. (author)

Published in:

JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN ; 36 ; 163-168

Publication date:

2001-01-01

Size:

6 pages

ISSN:

0309-3247

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 624.176

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