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In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics
In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics
In situ transmission electron microscopy observations of electric-field-induced domain switching and microcracking in ferroelectric ceramics
Tan, X. (author) / Xu, Z. (author) / Shang, J. K. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- A ; 314 ; 157 - 161
2001-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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