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    In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

    New search for: Xu, Z.

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    In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

    New search for: Xu, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

    New search for: Xu, Z.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    In situ TEM study of electric field-induced microcracking in piezoelectric single crystals

    Contributors:

    Xu, Z. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 99 ; 106-111

    Publication date:

    2003-01-01

    Size:

    6 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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