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    Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering

    New search for: Frost, F.
    New search for: Hirsch, D.
    New search for: Schindler, A.

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    Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering

    New search for: Frost, F.
    New search for: Hirsch, D.
    New search for: Schindler, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering

    New search for: Frost, F.
    New search for: Hirsch, D.
    New search for: Schindler, A.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Evaluation of AFM tips using nanometer-sized structures induced by ion sputtering

    Contributors:

    Frost, F. (author) / Hirsch, D. (author) / Schindler, A. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 179 ; 8-12

    Publication date:

    2001-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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