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    Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS

    New search for: Oechsner, H.
    New search for: Westermeyr, S.
    New search for: Ye, J.

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    Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS

    New search for: Oechsner, H.
    New search for: Westermeyr, S.
    New search for: Ye, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS

    New search for: Oechsner, H.
    New search for: Westermeyr, S.
    New search for: Ye, J.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Characterization of sputter deposited cBN-films by low energy electron loss spectroscopy LEELS

    Contributors:

    Oechsner, H. (author) / Westermeyr, S. (author) / Ye, J. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 179 ; 89-95

    Publication date:

    2001-01-01

    Size:

    7 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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