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Characterisation of Cr intermediate layers in Cu-C-system with SIMS method

Mayerhofer, K. E. / Neubauer, E. / Eisenmenger-Sittner, C. / Hutter, H.

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Characterisation of Cr intermediate layers in Cu-C-system with SIMS method

Mayerhofer, K. E. / Neubauer, E. / Eisenmenger-Sittner, C. / Hutter, H.

Characterisation of Cr intermediate layers in Cu-C-system with SIMS method

Mayerhofer, K. E. / Neubauer, E. / Eisenmenger-Sittner, C. / Hutter, H.

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Order at Subito €

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Document information

Title:

Characterisation of Cr intermediate layers in Cu-C-system with SIMS method

Contributors:

Mayerhofer, K. E. (author) / Neubauer, E. (author) / Eisenmenger-Sittner, C. (author) / Hutter, H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 179 ; 276-281

Publication date:

2001-01-01

Size:

6 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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