SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment: Fid-Bau Portal

SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment

Konarski, P. / Cwil, M. / Piekoszewski, J. / Stanislawski, J.

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SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment

Konarski, P. / Cwil, M. / Piekoszewski, J. / Stanislawski, J.

SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment

Konarski, P. / Cwil, M. / Piekoszewski, J. / Stanislawski, J.

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Order at Subito €

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Document information

Title:

SIMS characterisation of superconductive MgB2 layers prepared by ion implantation and pulsed plasma treatment

Contributors:

Konarski, P. (author) / Cwil, M. (author) / Piekoszewski, J. (author) / Stanislawski, J. (author)

Published in:

APPLIED SURFACE SCIENCE ; 252 ; 7078-7081

Publication date:

2006-01-01

Size:

4 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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