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Microstructure and electrical properties of magnetic tunneling junctions: Ta/NiFe/IrMn/M/Al-oxide/M/NiFe (M=Co, NiFe, CoFe)
Microstructure and electrical properties of magnetic tunneling junctions: Ta/NiFe/IrMn/M/Al-oxide/M/NiFe (M=Co, NiFe, CoFe)
Microstructure and electrical properties of magnetic tunneling junctions: Ta/NiFe/IrMn/M/Al-oxide/M/NiFe (M=Co, NiFe, CoFe)
Chang, P. J. (author) / Lee, J. H. (author) / Youn, S. G. (author) / Yoon, C. S. (author) / Kim, C. K. (author) / Song, O. (author)
MATERIALS SCIENCE AND ENGINEERING -LAUSANNE- B ; 86 ; 48 - 52
2001-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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