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    Thermal stability of the exchange-biased NiFe/IrMn/CoFe electrode in the magnetic tunnel junctions

    New search for: Jeong, H. D.
    New search for: Lee, J. H.
    New search for: Yoon, C. S.
    New search for: Kim, C. K.
    New search for: Yuh, J. H.

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    Thermal stability of the exchange-biased NiFe/IrMn/CoFe electrode in the magnetic tunnel junctions

    New search for: Jeong, H. D.
    New search for: Lee, J. H.
    New search for: Yoon, C. S.
    New search for: Kim, C. K.
    New search for: Yuh, J. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Thermal stability of the exchange-biased NiFe/IrMn/CoFe electrode in the magnetic tunnel junctions

    New search for: Jeong, H. D.
    New search for: Lee, J. H.
    New search for: Yoon, C. S.
    New search for: Kim, C. K.
    New search for: Yuh, J. H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Thermal stability of the exchange-biased NiFe/IrMn/CoFe electrode in the magnetic tunnel junctions

    Contributors:

    Jeong, H. D. (author) / Lee, J. H. (author) / Yoon, C. S. (author) / Kim, C. K. (author) / Yuh, J. H. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 199 ; 6-10

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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