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    Characterization of copper ion sensing thiacalix[4]arene films evaporated on semiconductor substrates

    New search for: Ben Ali, M.
    New search for: Jaffrezic-Renault, N.
    New search for: Martelet, C.
    New search for: Ben Ouada, H.
    New search for: Davenas, J.
    New search for: Charbonnier, M.

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    Characterization of copper ion sensing thiacalix[4]arene films evaporated on semiconductor substrates

    New search for: Ben Ali, M.
    New search for: Jaffrezic-Renault, N.
    New search for: Martelet, C.
    New search for: Ben Ouada, H.
    New search for: Davenas, J.
    New search for: Charbonnier, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of copper ion sensing thiacalix[4]arene films evaporated on semiconductor substrates

    New search for: Ben Ali, M.
    New search for: Jaffrezic-Renault, N.
    New search for: Martelet, C.
    New search for: Ben Ouada, H.
    New search for: Davenas, J.
    New search for: Charbonnier, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

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    Document information
    Title:

    Characterization of copper ion sensing thiacalix[4]arene films evaporated on semiconductor substrates

    Contributors:

    Ben Ali, M. (author) / Jaffrezic-Renault, N. (author) / Martelet, C. (author) / Ben Ouada, H. (author) / Davenas, J. (author) / Charbonnier, M. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING -AMSTERDAM THEN LAUSANNE- C ; 14 ; 17-23

    Publication date:

    2001-01-01

    Size:

    7 pages

    ISSN:

    0928-4931

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1 / 660

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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