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Development of High-temperature Microsample Testing

Zupan, M. / Hayden, M. J. / Boehlert, C. J. / Hemker, K. J.

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Development of High-temperature Microsample Testing

Zupan, M. / Hayden, M. J. / Boehlert, C. J. / Hemker, K. J.

Development of High-temperature Microsample Testing

Zupan, M. / Hayden, M. J. / Boehlert, C. J. / Hemker, K. J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

Development of High-temperature Microsample Testing

Contributors:

Zupan, M. (author) / Hayden, M. J. (author) / Boehlert, C. J. (author) / Hemker, K. J. (author)

Published in:

EXPERIMENTAL MECHANICS ; 41 ; 242-247

Publication date:

2001-01-01

Size:

6 pages

ISSN:

0014-4851

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.1

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