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    Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

    New search for: Pezoldt, J.
    New search for: Forster, C.
    New search for: Weih, P.
    New search for: Masri, P.

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    Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

    New search for: Pezoldt, J.
    New search for: Forster, C.
    New search for: Weih, P.
    New search for: Masri, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

    New search for: Pezoldt, J.
    New search for: Forster, C.
    New search for: Weih, P.
    New search for: Masri, P.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Electrical characterization of SiC/Si heterostructures with Ge-modified interfaces

    Contributors:

    Pezoldt, J. (author) / Forster, C. (author) / Weih, P. (author) / Masri, P. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 184 ; 79-83

    Publication date:

    2001-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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