A platform for research: civil engineering, architecture and urbanism
A platform for research: civil engineering, architecture and urbanism
Non-invasive electrical characterization of semiconductor interfaces
Non-invasive electrical characterization of semiconductor interfaces
Non-invasive electrical characterization of semiconductor interfaces
Vanderhaghen, R. (author) / Kasouit, S. (author) / Conde, J. P. (author) / Cho, H. M. (author) / Chu, V. (author) / Lee, Y. W. (author) / Kim, H. J. (author) / Kim, S. Y. (author) / Kleider, J. P. (author)
MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 102 ; 156-160
2003-01-01
5 pages
Article (Journal)
English
DDC:
620.11
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