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    Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature

    New search for: Kerdiles, S.
    New search for: Madelon, R.
    New search for: Rizk, R.

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    Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature

    New search for: Kerdiles, S.
    New search for: Madelon, R.
    New search for: Rizk, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature

    New search for: Kerdiles, S.
    New search for: Madelon, R.
    New search for: Rizk, R.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic ellipsometry analysis of nanocrystalline silicon carbide obtained at low temperature

    Contributors:

    Kerdiles, S. (author) / Madelon, R. (author) / Rizk, R. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 184 ; 150-155

    Publication date:

    2001-01-01

    Size:

    6 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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