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    Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures

    New search for: Pickering, C.
    New search for: Canham, L. T.
    New search for: Brumhead, D.

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    Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures

    New search for: Pickering, C.
    New search for: Canham, L. T.
    New search for: Brumhead, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures

    New search for: Pickering, C.
    New search for: Canham, L. T.
    New search for: Brumhead, D.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
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    Document information
    Similar titles

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    Document information
    Title:

    Spectroscopic ellipsometry characterisation of light-emitting porous silicon structures

    Contributors:

    Pickering, C. (author) / Canham, L. T. (author) / Brumhead, D. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 63 ; 22

    Publication date:

    1993-01-01

    Size:

    22 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    Unknown

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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