Focused ion beam sputtering investigations on SiC: Fid-Bau Portal

Focused ion beam sputtering investigations on SiC

Bischoff, L. / Teichert, J. / Heera, V.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Focused ion beam sputtering investigations on SiC

Bischoff, L. / Teichert, J. / Heera, V.

Focused ion beam sputtering investigations on SiC

Bischoff, L. / Teichert, J. / Heera, V.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

Similar titles

Export, share and cite

Document information

Title:

Focused ion beam sputtering investigations on SiC

Contributors:

Bischoff, L. (author) / Teichert, J. (author) / Heera, V. (author)

Published in:

APPLIED SURFACE SCIENCE ; 184 ; 372-376

Publication date:

2001-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

Shah, S. I. | British Library Conference Proceedings | 1995

Focused Ion Beam Systems

British Library Online Contents | 2007

Focused ion beam production of nanoelectrode arrays

Errachid, A. / Mills, C. A. / Pla-Roca, M. et al. | British Library Online Contents | 2008

Focused electron beam-induced deposition at cryogenic temperatures

Bresin, M. / Thiel, B.L. / Toth, M. et al. | British Library Online Contents | 2011

Advanced Geometrical Modeling of Focused Beam Reflectance Measurements (FBRM)

Kail, N. / Briesen, H. / Marquardt, W. | British Library Online Contents | 2007