Study of microstructure in SrTiO~3/Si by high-resolution transmission electron microscopy: Fid-Bau Portal

Study of microstructure in SrTiO~3/Si by high-resolution transmission electron microscopy

Yang, G. Y. / Finder, J. M. / Wang, J. / Wang, Z. L. / Yu, Z. / Ramdani, J. / Droopad, R. / Eisenbeiser, K. W. / Ramesh, R.

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Study of microstructure in SrTiO~3/Si by high-resolution transmission electron microscopy

Yang, G. Y. / Finder, J. M. / Wang, J. / Wang, Z. L. / Yu, Z. / Ramdani, J. / Droopad, R. / Eisenbeiser, K. W. / Ramesh, R.

Study of microstructure in SrTiO~3/Si by high-resolution transmission electron microscopy

Yang, G. Y. / Finder, J. M. / Wang, J. / Wang, Z. L. / Yu, Z. / Ramdani, J. / Droopad, R. / Eisenbeiser, K. W. / Ramesh, R.

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Title:

Study of microstructure in SrTiO~3/Si by high-resolution transmission electron microscopy

Contributors:

Yang, G. Y. (author) / Finder, J. M. (author) / Wang, J. (author) / Wang, Z. L. (author) / Yu, Z. (author) / Ramdani, J. (author) / Droopad, R. (author) / Eisenbeiser, K. W. (author) / Ramesh, R. (author)

Published in:

JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 204-213

Publication date:

2002-01-01

Size:

10 pages

ISSN:

0884-2914

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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