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Application software for data analysis for three-dimensional atom probe microscopy

Hellman, O. / Vandenbroucke, J. / Blatz du Rivage, J. / Seidman, D. N.

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Application software for data analysis for three-dimensional atom probe microscopy

Hellman, O. / Vandenbroucke, J. / Blatz du Rivage, J. / Seidman, D. N.

Application software for data analysis for three-dimensional atom probe microscopy

Hellman, O. / Vandenbroucke, J. / Blatz du Rivage, J. / Seidman, D. N.

Access

Access via TIB

Check availability in my library

Order at Subito €

Page navigation

Document information

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Document information

Title:

Application software for data analysis for three-dimensional atom probe microscopy

Contributors:

Hellman, O. (author) / Vandenbroucke, J. (author) / Blatz du Rivage, J. (author) / Seidman, D. N. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING A -LAUSANNE- ; 327 ; 29 - 33

Publication date:

2002-01-01

Size:

5 pages

ISSN:

0921-5093

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

Cerezo, A. / Godfrey, T. J. / Hyde, J. M. et al. | British Library Online Contents | 1994

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Progress in the Atomic-Scale Analysis of Materials with the Three-Dimensional Atom Probe

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High resolution transmission electron microscopy and three-dimensional atom probe microscopy as complementary techniques for the high spatial resolution analysis of GaN based quantum well systems

Oliver, R.A. / Galtrey, M.J. / Humphreys, C.J. | British Library Online Contents | 2008

Improvements in the mass resolution of the three-dimensional atom probe

Sijbrandij, S. J. / Cerezo, A. / Godfrey, T. J. et al. | British Library Online Contents | 1996