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Structural characterization of chemically deposited Bi2S3 and Bi2Se3 thin films
Structural characterization of chemically deposited Bi2S3 and Bi2Se3 thin films
Structural characterization of chemically deposited Bi2S3 and Bi2Se3 thin films
Lokhande, C. D. (author) / Sankapal, B. R. (author) / Mane, R. S. (author) / Pathan, H. M. (author) / Muller, M. (author) / Giersig, M. (author) / Tributsch, H. (author) / Ganeshan, V. (author)
APPLIED SURFACE SCIENCE ; 187 ; 108-115
2002-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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