Fachinformationsdienst BAUdigital

A platform for research: civil engineering, architecture and urbanism

    Nondestructive measurement of resistivity in bulk InxGa1-xAs crystals

    New search for: Fukuzawa, M.
    New search for: Yoshida, M.
    New search for: Yamada, M.
    New search for: Hanaue, Y.
    New search for: Kinoshita, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Nondestructive measurement of resistivity in bulk InxGa1-xAs crystals

    New search for: Fukuzawa, M.
    New search for: Yoshida, M.
    New search for: Yamada, M.
    New search for: Hanaue, Y.
    New search for: Kinoshita, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nondestructive measurement of resistivity in bulk InxGa1-xAs crystals

    New search for: Fukuzawa, M.
    New search for: Yoshida, M.
    New search for: Yamada, M.
    New search for: Hanaue, Y.
    New search for: Kinoshita, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Nondestructive measurement of resistivity in bulk InxGa1-xAs crystals

    Contributors:

    Fukuzawa, M. (author) / Yoshida, M. (author) / Yamada, M. (author) / Hanaue, Y. (author) / Kinoshita, K. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 376 - 378

    Publication date:

    2002-01-01

    Size:

    3 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

    Similar titles

    Nondestructive Evaluation of Thermally Degraded 2.25Cr-1Mo Steel by Electrical Resistivity Measurement

    Byeon, J. W. / Kwun, S. I. | British Library Online Contents | 2003

    The influence of residual strain on Raman scattering in InxGa1-xAs single crystals

    Islam, M. R. / Verma, P. / Yamada, M. et al. | British Library Online Contents | 2002

    Solution Growth of p-Type 4H-SiC Bulk Crystals with Low Resistivity

    Shirai, T. / Danno, K. / Seki, A. et al. | British Library Online Contents | 2014

    Nondestructive Determination of Pavement Thickness Using Electrical Resistivity Techniques

    J. E. Russell / T. K. Oliver / P. F. Gnirk | NTIS | 1972

    Optical characterization of InxGa1-xN alloys

    Gartner, M. / Kruse, C. / Modreanu, M. et al. | British Library Online Contents | 2006

    Back to top