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High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films

Zielinska-Rohozinska, E. / Regulska, M. / Harutyunyan, V. S. / Paku&lz.shtsls / a, K. / Borowski, J.

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High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films

Zielinska-Rohozinska, E. / Regulska, M. / Harutyunyan, V. S. / Paku&lz.shtsls / a, K. / Borowski, J.

High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films

Zielinska-Rohozinska, E. / Regulska, M. / Harutyunyan, V. S. / Paku&lz.shtsls / a, K. / Borowski, J.

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Title:

High resolution X-ray diffraction defect structure characterization in Si-doped and undoped GaN films

Contributors:

Zielinska-Rohozinska, E. (author) / Regulska, M. (author) / Harutyunyan, V. S. (author) / Paku&lz.shtsls (author) / a, K. (author) / Borowski, J. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 91-92 ; 441 - 444

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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