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    Using of the Michelson Microwave Interferometer for the Measurement of Permittivity of Thin-Layer Materials

    New search for: Borisov, V. I.
    New search for: Karpenko, A. V.

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    Using of the Michelson Microwave Interferometer for the Measurement of Permittivity of Thin-Layer Materials

    New search for: Borisov, V. I.
    New search for: Karpenko, A. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Using of the Michelson Microwave Interferometer for the Measurement of Permittivity of Thin-Layer Materials

    New search for: Borisov, V. I.
    New search for: Karpenko, A. V.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Title:

    Using of the Michelson Microwave Interferometer for the Measurement of Permittivity of Thin-Layer Materials

    Contributors:

    Borisov, V. I. (author) / Karpenko, A. V. (author)

    Published in:

    RUSSIAN JOURNAL OF NONDESTRUCTIVE TESTING C/C OF DEFEKTOSKOPIIA ; 37 ; 597-599

    Publication date:

    2001-01-01

    Size:

    3 pages

    ISSN:

    1061-8309

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.1127

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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