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Structural characterization of InGaAs/InP heterostructures grown under compressive and tensile stress
Structural characterization of InGaAs/InP heterostructures grown under compressive and tensile stress
Structural characterization of InGaAs/InP heterostructures grown under compressive and tensile stress
Salviati, G. ( author ) / Ferrari, C. ( author ) / Lazzarini, L. ( author ) / Nasi, L. ( author ) / Drigo, A. V. ( author ) / Berti, M. ( author ) / De Salvador, D. ( author ) / Natali, M. ( author ) / Mazzer, M. ( author )
APPLIED SURFACE SCIENCE ; 188 ; 36-48
2002-01-01
13 pages
Article (Journal)
English
DDC:
621.35
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