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Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P. O. A. / Jacobson, H. / Molina-Aldareguia, J. M. / Bergman, J. P. / Tuomi, T. / Clegg, W. J. / Janzen, E. / Hultman, L.

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Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P. O. A. / Jacobson, H. / Molina-Aldareguia, J. M. / Bergman, J. P. / Tuomi, T. / Clegg, W. J. / Janzen, E. / Hultman, L.

Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Persson, P. O. A. / Jacobson, H. / Molina-Aldareguia, J. M. / Bergman, J. P. / Tuomi, T. / Clegg, W. J. / Janzen, E. / Hultman, L.

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Document information

Title:

Structural Defects in Electrically Degraded 4H-SiC PiN Diodes

Contributors:

Persson, P. O. A. (author) / Jacobson, H. (author) / Molina-Aldareguia, J. M. (author) / Bergman, J. P. (author) / Tuomi, T. (author) / Clegg, W. J. (author) / Janzen, E. (author) / Hultman, L. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 423-426

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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