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RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers

Scharmann, F. / Pezoldt, J.

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RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers

Scharmann, F. / Pezoldt, J.

RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers

Scharmann, F. / Pezoldt, J.

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Check availability in my library

Order at Subito €

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Document information

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Document information

Title:

RHEED: A Tool for Structural Investigations of Thin Polytypic SiC Layers

Contributors:

Scharmann, F. (author) / Pezoldt, J. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 463-466

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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