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Radiation-Induced Defects in p-Type Silicon Carbide

Kanazawa, S. / Okada, M. / Nozaki, T. / Shin, K. / Ishihara, S. / Kimura, I.

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Radiation-Induced Defects in p-Type Silicon Carbide

Kanazawa, S. / Okada, M. / Nozaki, T. / Shin, K. / Ishihara, S. / Kimura, I.

Radiation-Induced Defects in p-Type Silicon Carbide

Kanazawa, S. / Okada, M. / Nozaki, T. / Shin, K. / Ishihara, S. / Kimura, I.

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Check availability in my library

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Document information

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Document information

Title:

Radiation-Induced Defects in p-Type Silicon Carbide

Contributors:

Kanazawa, S. (author) / Okada, M. (author) / Nozaki, T. (author) / Shin, K. (author) / Ishihara, S. (author) / Kimura, I. (author)

Published in:

MATERIALS SCIENCE FORUM ; 389/393 ; 521-524

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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