A platform for research: civil engineering, architecture and urbanism
Characterization of Bulk and Epitaxial SiC Material Using Photoluminescence Spectroscopy
Characterization of Bulk and Epitaxial SiC Material Using Photoluminescence Spectroscopy
Characterization of Bulk and Epitaxial SiC Material Using Photoluminescence Spectroscopy
Henry, A. (author) / Ellison, A. (author) / Forsberg, U. (author) / Magnusson, B. (author) / Pozina, G. (author) / Janzen, E. (author)
MATERIALS SCIENCE FORUM ; 389/393 ; 593-596
2002-01-01
4 pages
Article (Journal)
English
DDC:
620.11
© Metadata Copyright the British Library Board and other contributors. All rights reserved.
British Library Online Contents | 2008
|Characterization of SiC Epitaxial Wafers by Photoluminescence under Deep UV Excitation
British Library Online Contents | 2002
|Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy
British Library Online Contents | 2001
|Photoluminescence of Bulk Si-Ge Single Crystals
British Library Online Contents | 1995
|Structural defects in bulk and epitaxial CdTe
British Library Online Contents | 1993
|