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    Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy

    New search for: Masarotto, L.
    New search for: Bluet, J. M.
    New search for: Berenguer, M.
    New search for: Girard, P.
    New search for: Guillot, G.

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    Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy

    New search for: Masarotto, L.
    New search for: Bluet, J. M.
    New search for: Berenguer, M.
    New search for: Girard, P.
    New search for: Guillot, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy

    New search for: Masarotto, L.
    New search for: Bluet, J. M.
    New search for: Berenguer, M.
    New search for: Girard, P.
    New search for: Guillot, G.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Defects Characterization in SiC by Scanning Photoluminescence Spectroscopy

    Contributors:

    Masarotto, L. (author) / Bluet, J. M. (author) / Berenguer, M. (author) / Girard, P. (author) / Guillot, G. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 353/356 ; 393-396

    Publication date:

    2001-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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