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    Sensitive Detection of Defects in alpha and beta SiC by Raman Scattering

    New search for: Nakashima, S.
    New search for: Nakatake, Y.
    New search for: Ishida, Y.
    New search for: Takahashi, T.
    New search for: Okumura, H.

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    Sensitive Detection of Defects in alpha and beta SiC by Raman Scattering

    New search for: Nakashima, S.
    New search for: Nakatake, Y.
    New search for: Ishida, Y.
    New search for: Takahashi, T.
    New search for: Okumura, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Sensitive Detection of Defects in alpha and beta SiC by Raman Scattering

    New search for: Nakashima, S.
    New search for: Nakatake, Y.
    New search for: Ishida, Y.
    New search for: Takahashi, T.
    New search for: Okumura, H.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Page navigation

    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    Sensitive Detection of Defects in alpha and beta SiC by Raman Scattering

    Contributors:

    Nakashima, S. (author) / Nakatake, Y. (author) / Ishida, Y. (author) / Takahashi, T. (author) / Okumura, H. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 389/393 ; 629-632

    Publication date:

    2002-01-01

    Size:

    4 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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