Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy: Fid-Bau Portal

Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

Naranjo, F. B. / Fernandez, S. / Sanchez-Garcia, M. A. / Calle, F. / Calleja, E. / Trampert, A. / Ploog, K. H.

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Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

Naranjo, F. B. / Fernandez, S. / Sanchez-Garcia, M. A. / Calle, F. / Calleja, E. / Trampert, A. / Ploog, K. H.

Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

Naranjo, F. B. / Fernandez, S. / Sanchez-Garcia, M. A. / Calle, F. / Calleja, E. / Trampert, A. / Ploog, K. H.

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Title:

Structural and optical characterization of thick InGaN layers and InGaN/GaN MQW grown by molecular beam epitaxy

Contributors:

Naranjo, F. B. (author) / Fernandez, S. (author) / Sanchez-Garcia, M. A. (author) / Calle, F. (author) / Calleja, E. (author) / Trampert, A. (author) / Ploog, K. H. (author)

Published in:

MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 93 ; 131 - 134

Publication date:

2002-01-01

Size:

4 pages

ISSN:

0921-5107

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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