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    The elimination of the `artifact` in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

    New search for: Okamoto, K.
    New search for: Sugawara, Y.
    New search for: Morita, S.

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    The elimination of the `artifact` in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

    New search for: Okamoto, K.
    New search for: Sugawara, Y.
    New search for: Morita, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    The elimination of the `artifact` in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

    New search for: Okamoto, K.
    New search for: Sugawara, Y.
    New search for: Morita, S.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

    Export, share and cite

    Document information
    Title:

    The elimination of the `artifact` in the electrostatic force measurement using a novel noncontact atomic force microscope/electrostatic force microscope

    Contributors:

    Okamoto, K. (author) / Sugawara, Y. (author) / Morita, S. (author)

    Published in:

    APPLIED SURFACE SCIENCE ; 188 ; 381-385

    Publication date:

    2002-01-01

    Size:

    5 pages

    ISSN:

    0169-4332

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  621.35

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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