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Atom manipulation and image artifact on Si(111)7x7 surface using a low temperature noncontact atomic force microscope
Atom manipulation and image artifact on Si(111)7x7 surface using a low temperature noncontact atomic force microscope
Atom manipulation and image artifact on Si(111)7x7 surface using a low temperature noncontact atomic force microscope
Sugawara, Y. (author) / Sano, Y. (author) / Suehira, N. (author) / Morita, S. (author)
APPLIED SURFACE SCIENCE ; 188 ; 285-291
2002-01-01
7 pages
Article (Journal)
English
DDC:
621.35
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