Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe: Fid-Bau Portal

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Kageshima, M. / Jensenius, H. / Dienwiebel, M. / Nakayama, Y. / Tokumoto, H. / Jarvis, S. P. / Oosterkamp, T. H.

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Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Kageshima, M. / Jensenius, H. / Dienwiebel, M. / Nakayama, Y. / Tokumoto, H. / Jarvis, S. P. / Oosterkamp, T. H.

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Kageshima, M. / Jensenius, H. / Dienwiebel, M. / Nakayama, Y. / Tokumoto, H. / Jarvis, S. P. / Oosterkamp, T. H.

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Check availability in my library

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Document information

Title:

Noncontact atomic force microscopy in liquid environment with quartz tuning fork and carbon nanotube probe

Contributors:

Kageshima, M. (author) / Jensenius, H. (author) / Dienwiebel, M. (author) / Nakayama, Y. (author) / Tokumoto, H. (author) / Jarvis, S. P. (author) / Oosterkamp, T. H. (author)

Published in:

APPLIED SURFACE SCIENCE ; 188 ; 440-444

Publication date:

2002-01-01

Size:

5 pages

ISSN:

0169-4332

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 621.35

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