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    Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

    New search for: Bougrab, H.
    New search for: Inal, K.
    New search for: Berveiller, M.

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    Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

    New search for: Bougrab, H.
    New search for: Inal, K.
    New search for: Berveiller, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

    New search for: Bougrab, H.
    New search for: Inal, K.
    New search for: Berveiller, M.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Dislocation Microstructures Identification by X-Ray Diffraction-Line Broadening Analysis

    Contributors:

    Bougrab, H. (author) / Inal, K. (author) / Berveiller, M. (author)

    Published in:

    MATERIALS SCIENCE FORUM ; 404/407 ; 133-140

    Publication date:

    2002-01-01

    Size:

    8 pages

    ISSN:

    0255-5476

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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