Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation: Fid-Bau Portal

Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

Panicaud, B. / Renault, P.-O. / Grosseau-Poussard, J. L. / Dinhut, J. F. / Thiaudiere, D. / Gailhanou, M.

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Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

Panicaud, B. / Renault, P.-O. / Grosseau-Poussard, J. L. / Dinhut, J. F. / Thiaudiere, D. / Gailhanou, M.

Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

Panicaud, B. / Renault, P.-O. / Grosseau-Poussard, J. L. / Dinhut, J. F. / Thiaudiere, D. / Gailhanou, M.

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Title:

Measurement of Stress in Phosphated-Iron Oxide Layers by In-Situ Diffraction of Synchrotron Radiation

Contributors:

Panicaud, B. (author) / Renault, P.-O. (author) / Grosseau-Poussard, J. L. (author) / Dinhut, J. F. (author) / Thiaudiere, D. (author) / Gailhanou, M. (author)

Published in:

MATERIALS SCIENCE FORUM ; 404/407 ; 809-816

Publication date:

2002-01-01

Size:

8 pages

ISSN:

0255-5476

Type of media:

Article (Journal)

Type of material:

Language:

English

Classification:

DDC: 620.11

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