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Oxidation behavior of TiAlN barrier layers with and without thin metal overlayers for memory capacitor applications
Oxidation behavior of TiAlN barrier layers with and without thin metal overlayers for memory capacitor applications
Oxidation behavior of TiAlN barrier layers with and without thin metal overlayers for memory capacitor applications
Song, J. (author) / Kim, H. R. (author) / Park, J. (author) / Jeong, S. (author) / Hwang, C. S. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH- ; 17 ; 1789-1794
2002-01-01
6 pages
Article (Journal)
English
DDC:
620.11
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