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Reliability of BGA solder bumps Moire interferometry evaluates shock and vibration performance
Reliability of BGA solder bumps Moire interferometry evaluates shock and vibration performance
Reliability of BGA solder bumps Moire interferometry evaluates shock and vibration performance
Basaran, C. (author) / Cartwright, A. (author) / Zhao, Y. (author) / Dishongh, T. (author)
ADVANCED PACKAGING ; 11 ; 47-58
2002-01-01
12 pages
Article (Journal)
English
DDC:
658.564
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