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    Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

    New search for: Lan, T.

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    Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

    New search for: Lan, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

    New search for: Lan, T.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
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    Document information
    Title:

    Characterization of Electronic Transients by an Ultrafast Scanning Tunneling Microscope

    Contributors:

    Lan, T. (author)

    Published in:

    INTERNATIONAL JOURNAL OF NONLINEAR SCIENCES AND NUMERICAL SIMULATION ; 3 ; 617-620

    Publication date:

    2002-01-01

    Size:

    4 pages

    ISSN:

    1565-1339

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  515.355

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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