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    Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces

    New search for: Kuriyagawa, T.
    New search for: Yoshihara, N.
    New search for: Saeki, M.
    New search for: Syoji, K.
    New search for: Gao, Y.
    New search for: Tamaki, J.
    New search for: Kitajima, K.

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    Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces

    New search for: Kuriyagawa, T.
    New search for: Yoshihara, N.
    New search for: Saeki, M.
    New search for: Syoji, K.
    New search for: Gao, Y.
    New search for: Tamaki, J.
    New search for: Kitajima, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces

    New search for: Kuriyagawa, T.
    New search for: Yoshihara, N.
    New search for: Saeki, M.
    New search for: Syoji, K.
    New search for: Gao, Y.
    New search for: Tamaki, J.
    New search for: Kitajima, K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

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    Check availability in my library
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    Document information
    Title:

    Nano-Topography Characterization of Axisymmetrical Aspherical Ground Surfaces

    Contributors:

    Kuriyagawa, T. (author) / Yoshihara, N. (author) / Saeki, M. (author) / Syoji, K. (author) / Gao, Y. / Tamaki, J. / Kitajima, K.

    Published in:

    Advances in Abrasive Technology V ; 125-130

    KEY ENGINEERING MATERIALS

    Publication date:

    2003-01-01

    Size:

    6 pages

    ISSN:

    1013-9826

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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