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Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Leonard, K. J. (author) / Goyal, A. (author) / Kroeger, D. M. (author) / Jones, J. W. (author) / Kang, S. (author) / Rutter, N. (author) / Paranthaman, M. (author) / Lee, D. F. (author) / Kang, B. W. (author)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 18 ; 1109-1122
2003-01-01
14 pages
Article (Journal)
English
DDC:
620.11
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