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Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Thickness dependence of microstructure and critical current density of YBa~2Cu~3O~7~-~d~e~l~t~a on rolling-assisted biaxially textured substrates
Leonard, K. J. (Autor:in) / Goyal, A. (Autor:in) / Kroeger, D. M. (Autor:in) / Jones, J. W. (Autor:in) / Kang, S. (Autor:in) / Rutter, N. (Autor:in) / Paranthaman, M. (Autor:in) / Lee, D. F. (Autor:in) / Kang, B. W. (Autor:in)
JOURNAL OF MATERIALS RESEARCH -PITTSBURGH THEN WARRENDALE- ; 18 ; 1109-1122
01.01.2003
14 pages
Aufsatz (Zeitschrift)
Englisch
DDC:
620.11
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