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Physical characterization of thin ALD-Al2O3 films
Physical characterization of thin ALD-Al2O3 films
Physical characterization of thin ALD-Al2O3 films
Jakschik, S. (author) / Schroeder, U. (author) / Hecht, T. (author) / Krueger, D. (author) / Dollinger, G. (author) / Bergmaier, A. (author) / Luhmann, C. (author) / Bartha, J. W. (author)
APPLIED SURFACE SCIENCE ; 211 ; 352-359
2003-01-01
8 pages
Article (Journal)
English
DDC:
621.35
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