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    Local characterization of compositionally graded Pb(Zr,Ti)O3 thin films by scanning force microscope

    New search for: Zeng, H. R.
    New search for: Li, G. R.
    New search for: Yin, Q. R.
    New search for: Xu, Z. K.

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    Local characterization of compositionally graded Pb(Zr,Ti)O3 thin films by scanning force microscope

    New search for: Zeng, H. R.
    New search for: Li, G. R.
    New search for: Yin, Q. R.
    New search for: Xu, Z. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Local characterization of compositionally graded Pb(Zr,Ti)O3 thin films by scanning force microscope

    New search for: Zeng, H. R.
    New search for: Li, G. R.
    New search for: Yin, Q. R.
    New search for: Xu, Z. K.

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

    Access

    Access via TIB
    Check availability in my library
    Order at Subito €

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    Document information
    Similar titles

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    Document information
    Title:

    Local characterization of compositionally graded Pb(Zr,Ti)O3 thin films by scanning force microscope

    Contributors:

    Zeng, H. R. (author) / Li, G. R. (author) / Yin, Q. R. (author) / Xu, Z. K. (author)

    Published in:

    MATERIALS SCIENCE AND ENGINEERING B -LAUSANNE- ; 99 ; 234-237

    Publication date:

    2003-01-01

    Size:

    4 pages

    ISSN:

    0921-5107

    Type of media:

    Article (Journal)

    Type of material:

    Print

    Language:

    English

    Classification:

    DDC:  620.11

    © Metadata Copyright the British Library Board and other contributors. All rights reserved.

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